Microwave metrology and on-wafer measurements
30 October 2012
A good knowledge about theoretical and practical aspects of microwave measurement is necessary to keep up with the latest in technological developments. In Europe and the US, engineers and scientists enjoy regular access to workshops and meetings.
Now, a new initiative is bringing advanced training opportunities to the Asia-Pacific region. Metrologists will have the opportunity of attending both the Asia-Pacific Microwave Conference and this workshop, which will cover measurement issues in microwave technology.
The workshop is endorsed by the Microwave Measurement Committee (MTT-11) of the IEEE Microwave Theory and Technique Society and the High Frequency and Connector Technical Committee (TC-4) of the Instrumentation and Measurement Society. It is supported by the National Chip Implementation Center National Applied Research Laboratories (CIC/NARL), the Asia-Pacific Metrology Programme (APMP), the Member Center for Measurement Standards/ITRI and the National Measurement Laboratory.
For more information see: http://www.nml.org.tw/components/view_article.asp?sm_id=143&con_id=3435